SFB 1170


    Advanced nanoscale characterization and fabrication


    This service project will take care of central tasks related to advanced nanoscale characterization and fabrication techniques required for the study of topological materials with strong electron correlation and spin-orbit interaction. This in particular concerns the use of large-scale equipment for electron microscopy, ion beam etching, and lithographic nanostructuring operated by two central materials science facilities at the University of Würzburg, the Röntgen Center for Complex Material Systems (RCCM) with its Joint Analytical Laboratory (JAL) and the Gottfried-Landwehr-Laboratory for Nanotechnology (GLLN) [formerly known as Mikrostrukturlabor (ML)], respectively. The available experimental equipment will allow for the nm- or even atomic-scale analysis of structural properties and chemical composition of thin film or multilayer samples prepared by projects A04, A05, B01, and C08. These data will be the basis for a detailed understanding and optimization of the growth process performed by molecular beam epitaxy (MBE) or pulsed laser deposition (PLD).

    In addition, the project proposed here will be responsible for the design, construction, testing, and operation of two portable ultrahigh vacuum “suitcases” for in situ sample transfer between the various systems for thin film epitaxy and the surface science experiments of the SFB. This combination of sample supply and distribution, nanoscale fabrication and characterization, as well as surface analysis represents experimental capabilities that are unique to ToCoTronics.