Conference Proceedings and Journal Publications
2013
Th. Ebensperger, Ch. Rimbach, S. Zabler, R. Hanke, Detector Characterization for a Hig Resolution Laminography System, Frühjahrstagung der Deutschen Physikalischen Gesellschaft 2013, Regensburg
2012
Th. Ebensperger, Ph. Stahlhut, A. Balles, F. Nachtrab, R. Hanke, A comparison of different sources for lab-based X-ray microscopy, 14th International Workshop on Radiation Imaging Detectors, Figureira da Foz, Portugal
Ch. Fella, S. Zabler, F. Nachtrab, A. Dietrich, Th. Ebensperger, N. Uhlmann, R. Hanke, Frontiers of high-resolution and high-speed CT in industry and research, Optics+Photonics 2012
Ph. Stahlhut, Th. Ebensperger, S. Zabler, R. Hanke, NanoCT for your laboratory, 11th International Conference on X-ray Microscopy, Shanghai, China
A. Balles, S. Zabler, Th. Ebensperger, R. Hanke, Optimized detector concept for inline phase contrast and Born-type retrieval algorithms using polychromatic micro- and nano-focus X-ray Sources, 11th biennial Conference on High Resolution X-ray Diffraction and Imaging, St. Petersburg, Russia
2011
Frank Nachtrab , Thomas Ebensperger , Bernhard Schummer, Frank Sukowski, Randolf Hanke, Laboratory X-ray microscopy with a nano-focus X-ray source, 13th International Workshop on Radiation Imaging Detectors, Zürich 2011
http://dx.doi.org/10.1088/1748-0221-6-11-C11017
M. Firsching, F. Nachtrab, N. Uhlmann, R. Hanke, Multi-Energy X-Ray Imaging as a Quantitative Method for Materials Characterization, Advanced Materials, Wiley-VCH Verlag Weinheim, Apr. 2011
2010
M. Teßmann, S. Mohr, S. Gayetskyy, U. Haßler, R. Hanke, Automatic Determination of Fiber-Length Distribution in Composite Material using 3D CT Data, EURASIP Journal on Advances in Signal Processing (2010), S. Article ID 545030
B. Damm, R. Schmitt, A. Rehbein, R. Volk, E. Warrikhoff, R. Hanke, S. Kasperl, C. Funk, J. Hiller, M. Krumm, F. Sukowski, N. Uhlmann, R. Behrendt, Measurement of Shafts in the Production Process based on X-Rays, Optics, Photonics and Digital Technologies for Multimedia Applications, Proceedings of SPIE Volume: 7723, ISBN 9780819481962
2009
R. Hanke, F. Nachtrab, S. Burtzlaff et al. Setup of an Electron Probe Micro Analyzer for Highest Resolution Radioscopy, Nuclear Instruments & Methods in Physics, Research Section A, 607 (1) 173-175 (2009)
F. Nachtrab, T. Hofmann, N. Uhlmann, R. Hanke, Simple Solutions for Spectroscopic, Photon Counting X-ray Imaging Detectors, Conference Record IEEE NSS/MIC Orlando 2009
T. Wenzel, T. Stocker, R. Hanke, Searching for the Invisble using Fully Automatic X-ray Inspection, Foundry Trade Journal of the Institute of Cast Metals Engineers, Vol. 183, No 3666 (2009)
N. Uhlmann, J. Pavlovic, M. Hilbinger, R. Hanke, et al., Possibilities of High Resolvent X-ray Computer Tomography in the Analysis of Texture Features of Metallic Material, Congress on Engine Casting, Vol 2061, 81-89, Magdeburg 2009
2008
M. Salamon, R. Hanke, et al., Realization of a Computed Tomography Setup to Achieve Resolutions below 1 µm, Nuclear Instruments & Methods in Physics, Research Section A, 591 (1) 50-53 (2008)
R. Hanke, T. Fuchs, N. Uhlmann, X-ray based Methods for Non-destructive Testing and Material Characterization, Nuclear Instruments & Methods in Physics, Research Section A, 591 (1) 14-18 (2008)
M. Salamon, R. Hanke, et al., Comparison of Different Methods for Determining the Size of a Focal Spot of Microfocus X-ray Tubes, Nuclear Instruments & Methods in Physics, Research Section A, 591 (1) 54-58 (2008)
U. Haßler, M. Rehak, R. Hanke, Carbon Fiber Preform Inspection by Circular X-ray Tomosynthesis, Nuclear Science Symposium/Medical Imaging Conference, Conference Record IEEE NSS/MIC Dresden 2008
R. Hanke, T. Fuchs, Task Driven Design of X-ray Systems for Industrial Inspection, Nuclear Science Symposium/Medical Imaging Conference, Conference Record IEEE NSS/MIC Vols 1-9, 5425-5429, Dresden 2008
F. Nachtrab, M. Salamon, S. Burtzlaff, F. Porsch, W. Johannson, N. Uhlmann, R. Hanke, Progress in Sub-Micrometer Resolution Computed Tomography, IEEE Nuclear Science Symposium/Medical Imaging Conference, Conference Record IEEE NSS/MIC Vols 1-9, 5492-5495, Dresden 2008
